CSG11

AFM Probes for contact mode CSG11 series, each chip has two cantilevers, resonant frequency 7-14kHz, 14-28kHz; force constant 0,01-0,08N/m, 0,03-0,2N/m.

High Resolution CONTACT "GOLDEN" Silicon Cantilevers CSG11 series

Standard chip size: 1.6x3.6x0.4 mm.
High reflective Au coating (reflective property is 3 times better in comparison with uncoated cantilevers).
Typical curvature radius of a tip: 10 nm.
Tip height: 10 - 15 µm.
Each chip has two RECTANGULAR springs.
Recommended for contact mode.
Can be supplied with conductive TiN, Pt, Au coatings.
Packaged in GelPak® boxes.

GelPak® is a registered trade mark of Vichem Corporation.

Specification for probes of CSG11 series

Chip thickness	0.4mm
Reflective side	Au
Spring number	2
Aspect ratio	3:1
Cone angle f	<=22°
Curvature radius of a tip	typical 10nm

Cantilever series	Spring	Cantilever length, L±5µm	Cantilever width, W±3µm	Cantilever thickness, µm			Resonant frequency, kHz			Force constant, N/m
Cantilever series	Spring	Cantilever length, L±5µm	Cantilever width, W±3µm	min	typical	max	min	typical	max	min	typical	max
CSG11	A	250	35	0.7	1.0	1.3	14	20	28	0.03	0.1	0.2
CSG11	B	350	35	0.7	1.0	1.3	7	10	14	0.01	0.03	0.08

Highlights

Compatible with the most commercial SPM devices.

Chemically stable Au coating.
Silicon is doped by boron with the concentration about 5x10²⁰ cm^-3 to avoid electrostatic charges.

Cantilever series


Recommended measuring mode N - noncontact, semicontact C - contact	cantilever series	S - with calibrated SEM photo for each tip and guaranteed curvature radius 10nm or less.