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TOP VISUAL non-contact AFM probes (typical resonant frequency 300 kHz, typical force constant 50 N/m), Au reflective coating.

 

TOP VISUAL NONCONTACT Silicon Cantilevers VIT_P/IR series

 TOP VISUAL probes intended:
1.  For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
2. For precise positioning of a tightly focused laser spot at the tip end - for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).

 

 

Image in optical microscope
(TOP VISUAL probe is under the investigated sample).


Topography image of the sample made by TOP VISUAL probe.

 

VIT_P series specification

Material

Si

Chip size

3.4x1.6x0.3mm

Reflective side coating

Au

Front coating

None

Cantilever number

1 rectangular

Tip curvature radius

typical 6nm, guaranteed 10nm

Tip shape

Pyramidal

Tip height

14-16 um

 

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

VIT_P/IR

140

50

5.0

200

300

400

25

50

95