Surface science
A UHV surface analysis system for thin film depth profiling
Measures the surface composition of the first few nanometers and/or micrometers depth of solid samples
The Hiden SIMS Workstation provides for high performance static and dynamic SIMS applications for detailed surface composition analysis and depth profiling.
A UHV surface analysis system for thin film depth profiling
A design breakthrough for surface analysis
The Hiden Compact SIMS tool is designed for fast and easy characterisation of layer structures, surface contamination and impurities with sensitive detection of positive ions being assisted by the oxygen primary ion beam and provides isotopic sensitivity across the entire periodic table. The ion gun geometry set to provide is ideal for nanometre depth resolution and near surface analysis.
Automatic Surface Analysis System
Measures the surface composition of the first few nanometers and/or micrometers depth of solid samples
The Hiden AutoSIMS is a self-contained, automated, SIMS tool for routine and repetitive surface analysis, ideal for the measurement of thin films, contamination and doping from the top monolayer to many microns in both conductive and insulating material.