Features
- Extremely low dark counts
- Linear response due to single event counting
- 3 MHz count rate in 2D and 2D/time resolved mode
- Retrofitable on site, without changes to the analyzer
Applications
- Fermi surface mapping
- Band structure mapping
- Photoelectron diffraction measurements
- Angular dispersion experiments in 2D mode
- XPS, UPS, ESCA and AES in 7 channel mode
- Stroboscopic experiments in 2D/time resolved mode
- Time-of-flight measurements
Product Description
The delayline detector combines high countrates (3 MHz) with extremely high time resolution (190 ps) in one device. It is a time resolved 2D detector, equipped with two lateral and one time dimension and can be mounted on a PHOIBOS 100 or 150 analyzer. The delayline method is based on measuring the time differences of signals.