Sistema automatizzato AFM-Raman-SNOM per una ampia serie di applicazioni

Informazioni generali

Il primo strumento AFM-Raman-SNOM interamente automatizzato al mondo. È l'integrazione di un AFM con varie tecniche ottiche: microscopia confocale raman/a fluorescenza, SNOM, TERS, etc. Rende semplice una caratterizzazione comprensiva di un campione a livello nanometrico.


* Tip Enhanced Raman Scattering.

Due semplici passi per ottenere immagini Raman/Fluerescenza

Passo 1 Survey del campione (dopo aver rimosso il cantilever). Alta risoluzione e ampio campo visuale

Passo 2 Imamgini simultanee AFM e Raman/Fluorescenza dell'area selezionata



The new SPECTRUM instrument was developed based on NT-MDT more than 15 years experience in building AFM - Raman – SNOM systems. The unique features include: full automation, advanced AFM capabilities, complete integration with optical techniques. 

Unique integration of SPM with optics for AFM - Raman - SNOM – TERS


Unique SPM capabilities



Sample survey with high resolution. Automated high resolution AFM - Raman imaging without limitations of the piezo-scanner range. 



High-precision positioning motors allow to automate basic operations, including the adjustment of the OBD system, positioning of measuring heads and sample, etc. 


Automated sample positioning (35×35 mm)*

High precision positioning motors equipped with optical sensors allow automated AFM-Raman imaging of any sample areas (within 35mm×35mm travel range).


Cantilever deflection system auto alignment

In several seconds get the laser aligned to the tip and photodiode position optimized. Special algorithms give a high precision and high speed of cantilever deflection system alignment.



Mo oxide nanowires, 5 ×5 µm

CdS nanowires, 4 ×4 µm

 AFM  Mo oxide Raman peak  AFM  Fluorescense image  Overlapped Raman image
from CdS and PANI
  Artificial diamond characterization, 2 ×2 µm    Graphene, 5 ×5 µm
AFM topography Raman mapping of intensity of 1333 1/cm band AFM Raman map of 2D-band Raman map of G-band



Measuring modes and techniques

AFM (contact and amplitude modulation), AFM spectroscopy, AFM lithography (force, current, voltage), Raster Spring Imaging, Lateral Force Microscopy, Force Modulation Microscopy, Scanning Spreading Resistance Microscopy, Piezoresponse Force Microscopy and Switching Spectroscopy, EFM, Kelvin Probe Force Microscopy, MFM, STM (microscopy, spectroscopy, lithography).

Confocal Fluorescence microscopy, Confocal Raman microscopy, Confocal Rayleigh microscopy, TERS, TEFS, Wide field optical microscopy, SNOM (all types of probes, all modes)

Measuring heads

  • AFM,STM and Tuning Fork
  • Laser based cantilever deflection detection system automated adjustment and targeting


  • Dimensions: up to 50/10 mm in diameter/height
  • Sample weight: up to 2 kg
  • Heating: from RT to 150 °ะก

Scanning system

  • Scanning type: by sample
  • Range: 100x100×10 μm (CL)


  • Noise XY: no more 0.3 nm (with closed loop sensors)
  • Noise Z (RMS, 10-1000 Hz bandwidth): 0.06 nm (typical)

Sample positioning system

  • Movement: automated, binded with the videomicroscope
  • Range XY: 35x35 mm; 5×5 mm while using with the bottom objective
  • Min. step: 0.35 μm
  • Repositioning precision: 3 μm


  • Automated approach by tip
  • Range: 10 mm


  • Active vibration isolation system
  • Optical table (optional)

Optical parts

  • Spectral range*: 450-1050 nm
  • Spectral resolution: Depends on the grating and spectrometer used
  • Objectives:

    100x 0.7NA
    10x 0.28NA
    Any other objective (optional)

  • Detectors**:
    TE cooled (down to -100 °C) CCD camera.
    EMCCD camera is optional.
    Photon multiplier (PMT) or avalanche
    photodiode (APD) in photon counting mode or other type of CCD camera (UV, IR)
    Photon multiplier for fast confocal laser
    (Rayleigh) imaging
  • Confocal maps resolution***:
    with the probe, for blue laser with 100x 0.7NA
    XY: <400 nm
    Z: <800 nm
    without the probe, for blue laser with 100x 0.95NA
    XY: <250 nm
    Z: <500 nm
  • Bottom objective (optional)
    Movement: motor and piezo (optional)
    Range: 25 mm by motor, 100 μm by piezo
    Min. step: 0.1 μm by motor, 3 nm by piezo
    * Other spectral range available upon request.
    **Depends on the system configuration