Punte AFM per la tecnica in contatto, ogni punta ha due cantilever, frequenza di risonanza 7-14kHz, 14-28kHz; costante di forza 0,01-0,08N/m, 0,03-0,2N/m.

 

High Resolution CONTACT "GOLDEN" Silicon Cantilevers CSG11 series

  • Standard chip size: 1.6x3.6x0.4 mm.
  • High reflective Au coating (reflective property is 3 times better in comparison with uncoated cantilevers).
  • Typical curvature radius of a tip: 10 nm.
  • Tip height: 10 - 15 µm.
  • Each chip has two RECTANGULAR springs.
  • Recommended for contact mode.
  • Can be supplied with conductive TiNPt, Au coatings.
  • Packaged in GelPak® boxes.

GelPak® is a registered trade mark of Vichem Corporation.

Specification for probes of CSG11 series

Chip thickness 0.4mm
Reflective side Au
Spring number 2
Aspect ratio 3:1
Cone angle f <=22°
Curvature radius of a tip typical 10nm
   

 

Cantilever series

Spring

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness, µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

min

typical

max

CSG11

A

250

35

0.7

1.0

1.3

14

20

28

0.03

0.1

0.2

B

350

35

0.7

1.0

1.3

7

10

14

0.01

0.03

0.08

 

Highlights

Compatible with the most commercial SPM devices.

  • Chemically stable Au coating.
  • Silicon is doped by boron with the concentration about 5x1020 cm-3 to avoid electrostatic charges. 

 

 

Cantilever series

Recommended measuring mode
N - noncontact, semicontact
C - contact
cantilever series S - with calibrated SEM photo for each tip and guaranteed curvature radius 10nm or less.