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Automatic Surface Analysis System

AutoSIMS represents the sum of a combination of instrument developments undertaken for a range of customers. The result is an easy to use general purpose laboratory tool that can
undertake routine surface analysis measurements for product monitoring, failure analysis and verification tasks. Based around the geometry of the Compact SIMS, the AutoSIMS brings a
very high level of automation to surface analysis with a typical user training period of under a day required to perform both surface, imaging and 3D depth profiles.

Read more: New Hiden AutoSIMS

Hiden HPR-20 and QGA series quadrupole mass spectrometers are configurable for diverse real-time gas analysis applications by selection of the appropriate application-specific process interface. The latest interface - the all-new dual-stream capillary sampling interface - is developed for process monitoring under flowing conditions to enable fast sample switching between the feed and exhaust gas streams.

Read more: New Hiden Mass Spectrometers with Dual-Stream Sampling

 

We are glad to announce that we are the new agent of Kratos Analytical for all the products for surface analysis.

For the last 46 years Kratos Analytical has provided state-of-the-art spectrometers for surface analysis and we are committed to continuing with development of leading technologies. As we approach our fifth decade Kratos Analytical is still dedicated to providing service, quality and customer satisfaction.

You can see Kratos products by visiting the page:

 

www.kratos.com

 

 

Mass spectrometry in solid material

The Hiden Compact SIMS tool is designed for fast and easy characterisation of layer structures, surface contamination and impurities with sensitive detection of positive ions being assisted by the oxygen primary ion beam and provides isotopic sensitivity across the entire periodic table. The ion gun geometry is optimised to be ideal for nanometre depth resolution and near surface analysis.
A rotary carousel enables 10 samples to be simultaneously loaded for measurement into the dry-pumped vacuum chamber. The instrument has a small footprint and is exceptionally easy
to use, it boasts the same control software and ion gun system as the fully featured Hiden SIMS/SNMS Workstation family, providing depth profiles, 3D and 2D images and mass spectral data. The MAXIM-600P detector is based around the highly reliable Hiden 6mm triple quadrupole mass filter with pulse ion detection. An electron gun option is available for analysis of insulating samples.
In addition to SIMS, the Compact SIMS has an SNMS facility that is useful for quantification of high concentration elements, such as alloys.

Applications:

• Solar cells
• Glass coatings
• Metallic thin films

Features:

• Small footprint
• Easy user friendly” layout
• Positive SIMS and SNMS
• Depth Profiling
• 3D characterisation and imaging
• Mass spectra
• Isotopic analysis
• Analysis on the nanometre scale