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The effort to understand the universe is one of the very few things that lifts human life a little above the level of farce, and gives it some of the grace of tragedy

Steven Weinberg
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Our products

  • Alemnis
    • Alemnis Standard Assembly
  • ALTAMIRA INSTRUMENTS
    • AMI Family: Catalyst Characterization
    • BenchCAT™ : Customized Reactor Systems
    • µBenchCAT Bench-top Microreactor
    • Harsh Environment Systems
  • HIDEN ANALYTICAL
    • Gas Analysis
    • Dissolved Gas Analysis and Electrochemistry
    • Catalysis and Thermal Analysis
    • Thin Films, Plasma and Surface Engineering
    • Surface science
    • Residual Gas Analysis
    • Software
    • Applications
      • Gas Analysis
  • Korvus Technology
    • Thin films deposition systems
    • Deposition Components
  • Microsplav
    • The RTIM machine
    • Applications
  • NT-MDT
    • Automated AFM
    • BIO-AFM
    • AFM - Raman - SNOM - TERS
    • Modular AFM
  • Rtec Instruments
    • Multi function tribometer MFT-5000
  • SOL instruments
    • Raman Microscopy
    • Elemental Analysis
    • Spectroscopy/Imaging
  • SPECS
    • Spectroscopy
      • Detectors
    • Microscopy
  • UHV components

Accessories

  • AFM/SPM probes
  • Etalon series
    • Noncontact/Semicontact/Force Modulation AFM probes
    • Conductive AFM probes
  • GOLDEN series
    • Noncontact/Semicontact probes
    • Force Modulation Probes
    • Contact probes
    • Conductive Noncontact/Semicontact probes
      • Noncontact probes with PtIr conductive coating
      • Noncontact probes with TiN conductive coating
      • Noncontact probes with Au conductive coating
    • Magnetic probes
    • Tipless probes
  • Super Sharp (1nm) tips
  • "Whisker Type" probes --> high aspect ratio tips
    • Noncontact/Semicontact "Whisker Type" probes
    • Contact "Whisker Type" probes
  • Other special probes
    • Diamond Coated Conductive Probes
    • TOP VISUAL Probes
    • SThM probes
    • SNOM fiber probes
    • Colloidal probes
      • Cantilevers with submicron spheres attached to silicon tip
      • Cantilevers with micron spheres attached to tipless probes
  • Calibration Gratings
    • AFM calibration
    • AFM submicron calibration (278nm)
    • Test grating for SNOM
    • Grating sets
  • HOPG, Substrates, Test Samples
    • HOPG ZYA quality
    • HOPG ZYB quality
    • Sapphire substrates
    • Mica
    • Test samples
  • Consumables for pin on disk tribometers

Resources

  • Frequently asked questions
  • AFM artifacts
  • Downloads
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