Pra.Ma.

If you try and take a cat apart to see how it works, the first thing you have on your hands is a non-working cat

Douglas Adams
Toggle Navigation
  • Home
  • The company
  • Where we are
  • Contact us
  • Links
  • Search
  • Italiano
  • You are here:  
  • Home
  • Search

Our products

  • Minus K Technology
  • NT-MDT
    • Minus K Technology
    • Automated AFM
    • BIO-AFM
    • AFM - Raman - SNOM - TERS
    • Modular AFM
  • Microsplav
    • The RTIM machine
    • Applications
  • Rtec Instruments
    • Multi function tribometer MFT-5000
  • SPECS
    • Spectroscopy
      • Detectors
    • Microscopy
  • SOL instruments
    • Raman Microscopy
    • Elemental Analysis
    • Spectroscopy/Imaging
  • UHV components
  • Alemnis
    • Alemnis Standard Assembly
  • ALTAMIRA INSTRUMENTS
    • AMI Family: Catalyst Characterization
    • BenchCAT™ : Customized Reactor Systems
    • µBenchCAT Bench-top Microreactor
    • Harsh Environment Systems
  • HIDEN ANALYTICAL
    • Gas Analysis
    • Dissolved Gas Analysis and Electrochemistry
    • Catalysis and Thermal Analysis
    • Thin Films, Plasma and Surface Engineering
    • Surface science
    • Residual Gas Analysis
    • Software
    • Applications
      • Gas Analysis
  • Korvus Technology
    • Thin films deposition systems
    • Deposition Components

Accessories

  • AFM/SPM probes
  • Etalon series
    • Noncontact/Semicontact/Force Modulation AFM probes
    • Conductive AFM probes
  • GOLDEN series
    • Noncontact/Semicontact probes
    • Force Modulation Probes
    • Contact probes
    • Conductive Noncontact/Semicontact probes
      • Noncontact probes with PtIr conductive coating
      • Noncontact probes with TiN conductive coating
      • Noncontact probes with Au conductive coating
    • Magnetic probes
    • Tipless probes
  • Super Sharp (1nm) tips
  • "Whisker Type" probes --> high aspect ratio tips
    • Noncontact/Semicontact "Whisker Type" probes
    • Contact "Whisker Type" probes
  • Other special probes
    • Diamond Coated Conductive Probes
    • TOP VISUAL Probes
    • SThM probes
    • SNOM fiber probes
    • Colloidal probes
      • Cantilevers with submicron spheres attached to silicon tip
      • Cantilevers with micron spheres attached to tipless probes
  • Calibration Gratings
    • AFM calibration
    • AFM submicron calibration (278nm)
    • Test grating for SNOM
    • Grating sets
  • HOPG, Substrates, Test Samples
    • HOPG ZYA quality
    • HOPG ZYB quality
    • Sapphire substrates
    • Mica
    • Test samples
  • Consumables for pin on disk tribometers

Resources

  • Frequently asked questions
  • AFM artifacts
  • Downloads
Advanced Search

Here are a few examples of how you can use the search feature:

Entering this and that into the search form will return results with both "this" and "that".

Entering this not that into the search form will return results with "this" and not "that".

Entering this or that into the search form will return results with either "this" or "that".

Entering "this and that" (with quotes) into the search form will return results with the exact phrase "this and that".

Search results can also be filtered using a variety of criteria. Select one or more filters below to get started.






Back to Top

© 2025 Pra.Ma.