Physics is, hopefully, simple. Physicists are not.
Edward Teller
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Alemnis
Alemnis Standard Assembly
ALTAMIRA INSTRUMENTS
AMI Family: Catalyst Characterization
BenchCAT™ : Customized Reactor Systems
µBenchCAT Bench-top Microreactor
Harsh Environment Systems
HIDEN ANALYTICAL
Gas Analysis
Dissolved Gas Analysis and Electrochemistry
Catalysis and Thermal Analysis
Thin Films, Plasma and Surface Engineering
Surface science
Residual Gas Analysis
Software
Applications
Gas Analysis
Korvus Technology
Thin films deposition systems
Deposition Components
Microsplav
The RTIM machine
Applications
NT-MDT
Automated AFM
BIO-AFM
AFM - Raman - SNOM - TERS
Modular AFM
Rtec Instruments
Multi function tribometer MFT-5000
SOL instruments
Raman Microscopy
Elemental Analysis
Spectroscopy/Imaging
SPECS
Spectroscopy
Detectors
Microscopy
UHV components
Accessories
AFM/SPM probes
Etalon series
Noncontact/Semicontact/Force Modulation AFM probes
Conductive AFM probes
GOLDEN series
Noncontact/Semicontact probes
Force Modulation Probes
Contact probes
Conductive Noncontact/Semicontact probes
Noncontact probes with PtIr conductive coating
Noncontact probes with TiN conductive coating
Noncontact probes with Au conductive coating
Magnetic probes
Tipless probes
Super Sharp (1nm) tips
"Whisker Type" probes --> high aspect ratio tips
Noncontact/Semicontact "Whisker Type" probes
Contact "Whisker Type" probes
Other special probes
Diamond Coated Conductive Probes
TOP VISUAL Probes
SThM probes
SNOM fiber probes
Colloidal probes
Cantilevers with submicron spheres attached to silicon tip
Cantilevers with micron spheres attached to tipless probes
Calibration Gratings
AFM calibration
AFM submicron calibration (278nm)
Test grating for SNOM
Grating sets
HOPG, Substrates, Test Samples
HOPG ZYA quality
HOPG ZYB quality
Sapphire substrates
Mica
Test samples
Consumables for pin on disk tribometers
Resources
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AFM artifacts
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