Calibration Gratings

Company NT-MDT supply with the full set of calibration standards for SPM lateral and vertical calibration (including submicron calibration in X or Y direction), test grating for determination of the tip shape, SNOM test grating.

Test grating TGQ1 is intended for:

  • simultaneous calibration in X, Y and Z directions;
  • lateral calibration of SPM scanners;
  • detection of lateral non-linearity, hysteresis, creep and cross-coupling effects.

Test grating TGT1 is intended for:

  •  for 3-D visualization of the scanning tip;
  • determination of tip sharpness parameters (aspect ratio and curvature radius), tip degradation and contamination control.

Calibration grating  TGZ1 is intended for Z-axis calibration of scanning probe microscopes and nonlinearity measurements.

Calibration grating  TGZ3 is intended for Z-axis calibration of scanning probe microscopes and nonlinearity measurements.

Calibration grating  TGZ2 is intended for Z-axis calibration of scanning probe microscopes and nonlinearity measurements.

Calibration grating  TGZ4 is intended for Z-axis calibration of scanning probe microscopes and nonlinearity measurements.

Test grating TGG1 is intended for:

  • SPM calibration in X or Y axis;
  • detection of lateral and vertical scanner nonlinearity;
  • detection of angular distortion;
  • tip characterisation

Test grating TGX1 is intended for:

  •                       lateral calibration of SPM scanners;
  •                       detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects;
  •                       determination of the tip aspect ratio.

Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.

Standard test sample for Scanning Near Field Optical Microscope

  1. TGS1
  2. TGS2
  3. TGS1_PTB
  4. TGSFull

Subcategories

AFM calibration

Company NT-MDT supply with the full set of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.

AFM submicron calibration (278nm)

Company NT-MDT supply with the grating for SPM and STM submicron calibration in X or Y direction.

Test grating for SNOM

Company NT-MDT supply with the special test grating for Scanning Near Field Optical Microscope.

Grating sets

Company NT-MDT offers several different grating sets.