High Resolution NONCONTACT "GOLDEN" Silicon AFM Probes NSG01, (resonant frequency 87-230kHz, force constant 1,45-15,1N/m
Equipped with special alignment grooves for easy chip adjustment and laser alignment in SOLVER NANO and NANOEDUCATOR II microscopes (NT-MDT Co.)
NSG01_Ed series specification |
|
Material |
Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
|
|
Chip size
|
3.4x1.6x0.3mm
|
|
Reflective side
|
Al
|
|
Cantilever number
|
1 rectangular
|
|
Tip curvature radius
|
typical 6nm, guaranteed 10nm
|
|
Available coatings
|
|
Cantilever series |
Cantilever length, L±5µm
|
Cantilever width, W±3µm
|
Cantilever thickness,
T±0.5 µm
|
Resonant frequency, kHz
|
Force constant, N/m
|
||||
|
min
|
typical
|
max
|
min
|
typical
|
max
|
||||
|
NSG01_Ed
|
125
|
30
|
2.0
|
87
|
150
|
230
|
1.45
|
5.1
|
15.1
|
